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Applied scanning probe methods / [edited by] Bharat Bhushan, Harald Fuchs, Sumio Hosaka.
Material type:
TextSeries: Nanoscience and technologyPublication details: Berlin ; London : Springer, c2004. ISBN: 3540005277Subject(s): Scanning probe microscopy | Scanning probe microscopy -- Industrial applications | Materials -- MicroscopyDDC classification: 502.82 LOC classification: TA417.23
| Item type | Home library | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
Two Week Loan
|
College Lane Learning Resources Centre Main Shelves | 502.82 APP (Browse shelf(Opens below)) | Available | 6000750950 |
Total holds: 0
Enhanced descriptions from Syndetics:
Includes bibliographical references and index.