Residual stress measurement by X-ray diffraction.
Material type: TextSeries: HS ; 784Publication details: Warrendale, Pa. : SAE International, c2003.Edition: 2003 edISBN:- 0768010691
- 620.11230287 22
Item type | Home library | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|
Two Week Loan | College Lane Learning Resources Centre Main Shelves | 620.11230287 RES (Browse shelf(Opens below)) | Available | 6000663372 |
Total holds: 0
Enhanced descriptions from Syndetics:
Includes bibliographical references.