Syndetics cover image
Image from Syndetics

Residual stress measurement by X-ray diffraction.

Contributor(s): Society of Automotive EngineersMaterial type: TextTextSeries: HS ; 784Publication details: Warrendale, Pa. : SAE International, c2003. Edition: 2003 edISBN: 0768010691Subject(s): Residual stresses -- Measurement | X-ray crystallographyDDC classification: 620.11230287
Holdings
Item type Home library Call number Status Date due Barcode Item holds
Two Week Loan Two Week Loan College Lane Learning Resources Centre
Main Shelves
620.11230287 RES (Browse shelf(Opens below)) Available 6000663372
Total holds: 0

Enhanced descriptions from Syndetics:

Includes bibliographical references.

Powered by Koha